英语翻译(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-20

英语翻译(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-20
英语翻译
(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-2010).Luminescenceexperiments were carried out by exposingthe SiO2 nanowires to X-ray irradiation using a Philips set to deliver a dose of 20 Gy·min−1.Theluminescence emission of the sample was measured using a high-sensitivity multiplexed systemwith F/2.2 optics developed.Experiments were conducted at low (25\2240 K,heating rate 6K·min−1) and high (293\2673 K,heating rate 50 K·min−1) temperatures.2 Results and discussionSEM (fig.2(a)) image reveals the presence of white product on TiSi film.Under higher resolution,the white product consists of large quantities of wire-like materials and these wires arewinding,exhibiting smooth surface and uniform diameter (ca.40\290 nm).Further HRTEM examinationshows that the nanowires are amorphous (fig.2(c)) and EDX analyses indicate that theyconsist solely of silicon and oxygen (fig.2(d)).Computer analyses exhibit that the Si\4O ratio is1\42.Therefore,they are very long amorphous SiO2 nanowires.

英语翻译(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-20
(ii) The white sample was divided into four parts and separately wasobserved by SEM (Leo5420,10[1]20keV); by TEM (H-7100,120 keV; JEM-4000,400 keV) and by HRTEM.
(ii) 将白色样品分为四份,分别用扫描电镜（leo5420,10 20 keV）、透射电镜（H-7100,120 keV；JEM -4000,400 keV）和高分辨透射电子显微镜观察.
The compositionof the product was analyzed by energy dispersive X-ray (EDX,JEM-2010).
通过能量分散型X射线（EDX,JEM-2010）分析生成物的成分.
Luminescenceexperiments were carried out by exposing the SiO2 nanowires to X-rayirradiation using a Philips set to deliver a dose of 20 Gy•min−1.
通过飞利浦仪器提供20 Gy•min−1剂量将SiO2纳米线置于X射线照射下进行了发光实验.
Theluminescence emission of the sample was measured using a high-sensitivitymultiplexed system with F/2.2 optics developed.
用开发的带F / 2.2光学器件的高灵敏度多路复用系统测量了样品的荧光发射.
Experimentswere conducted at low (25 240 K,heating rate 6K•min−1)and high (293 673 K,heating rate 50 K•min−1)temperatures.
在低温（25 240 K,加热速率6K•min−1）和高温（293 673 K,50 K•min−1）条件下进行了实验.
2.Results anddiscussion
2.结果与讨论
SEM (fig.2(a))image reveals the presence of white product on TiSi film.
扫描电镜（图2（a））图像显示TiSi膜上有白色生成物.
Under higherresolution,the white product consists of large quantities of wire-likematerials and these wires are winding,exhibiting smooth surface and uniformdiameter (ca.40 90 nm).
在更高分辨率的条件下（可以看出）,白色生成物由大量的丝状材料构成,且这些线是弯曲的,有光滑的表面和均匀的直径（约40 90 nm）.
Further HRTEMexamination shows that the nanowires are amorphous (fig.2(c)) and EDX analysesindicate that they consist solely of silicon and oxygen (fig.2(d)).
用高分辨透射电子显微镜进行进一步检查表明,纳米线为非结晶的（图2（c））,而能谱分析表明,他们只是由硅和氧（图2（d））构成的.
Computeranalyses exhibit that the Si O ratio is 1 2.Therefore,they are very longamorphous SiO2 nanowires.
计算机分析表明,Si与O的比率为1:2.因此,他们是很长的非结晶SiO2纳米线.

(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420, 10\220 keV); by TEM(H-7100, 120 keV; JEM-4000, 400 keV)and by HRTEM. （2）白色的样品被分成四部分，并用扫描电镜（SEM， Leo5420，10 ...

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(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420, 10\220 keV); by TEM(H-7100, 120 keV; JEM-4000, 400 keV)and by HRTEM. （2）白色的样品被分成四部分，并用扫描电镜（SEM， Leo5420，10 20keV），透射电镜（(H-7100, 120 keV; JEM-4000, 400 keV)以及高分辨率透射电镜（HRTEM）单独进行了观察。The composition of theproduct was analyzed by energy dispersiveX-ray (EDX, JEM-2010).产品的组分用能量分散X射线法（EDX，JEM-2010）进行了分析。 Luminescence experiments were carried out by exposingthe SiO2 nanowires to X-ray irradiation using a Philips set to deliver a dose of 20 Gy·min−1. 发光实验通过将SiO2纳米线暴露于X射线辐射下进行，X射线辐射采用Philips公司的设备提供20 Gy·min−1的剂量The
人工翻译，请放心采纳。
luminescence emission of the sample was measured using a high-sensitivity multiplexed systemwith F/2.2 optics developed.样品的发光发射用一台高灵敏度的、带有所研制的F/2.2光学元件的复用系统进行测量。 Experiments were conducted at low (25\2240 K, heating rate 6K·min−1) and high (293\2673 K, heating rate 50 K·min−1) temperatures.实验在低温（25\2240 K, 加热速率 6K·min−12）和高温(293\2673 K, 加热速率 50 K·min−1)下进行。 Results and discussion 2.结果和讨论。SEM (fig. 2(a)) image reveals the presence of white product on TiSi film. Under higher resolution,the white product consists of large quantities of wire-like materials and these wires arewinding, exhibiting smooth surface and uniform diameter (ca. 40\290 nm).扫描电镜图像揭示了在TiSi薄膜上存在白色产物。在较高分辨率下，白色产物由大量线状的材料构成，这些线是缠绕的，呈现出光滑的表面和均匀的直径（ca.40\290 nm). Further HRTEM examination shows that the nanowires are amorphous (fig. 2(c)) and EDX analyses indicate that theyconsist solely of silicon and oxygen (fig. 2(d)). 进一步的HRTEM检验表明，这些纳米线是无定形的（图2（c)），而EDX分析表明，它们仅由硅和氧组成（图2（d)）。Computer analyses exhibit that the Si\4O ratio is1\42. Therefore, they are very long amorphous SiO2 nanowires.计算机分析表明，硅、氧的比率是1：2.因此它们是很长的无定形SiO2纳米线。

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白色样本划分的 intofour 部分，而且分别观察 bySEM （Leo5420，10 20 千电子伏） ；由透射电镜 (H-7100，120 千电子伏特 ；JEM-4000，400 千电子伏） 和由桐。组成的产品是通过能源 dispersiveX-雷 （EDX，正义与平等运动-2010 年） 进行分析。Luminescenceexperiments 是由 exposingthe SiO2 纳米...

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白色样本划分的 intofour 部分，而且分别观察 bySEM （Leo5420，10 20 千电子伏） ；由透射电镜 (H-7100，120 千电子伏特 ；JEM-4000，400 千电子伏） 和由桐。组成的产品是通过能源 dispersiveX-雷 （EDX，正义与平等运动-2010 年） 进行分析。Luminescenceexperiments 是由 exposingthe SiO2 纳米线的 x 射线照射使用飞利浦将给他们带来了剂量的 20 Gy·min−1 进行的。Theluminescence 排放的示例是使用开发的高灵敏度多路复用的关于 F/2.2 光学测量的。实验都在低进行 (25 240 K、 加热速率 6K·min−1) 和高 (293 673 K、 加热速率 50 K·min−1) temperatures.2 结果和 discussionSEM （图 2(a)) 图像显示的白色产品在泰国电影上存在。在更高的分辨率下白产品包括很大数量的丝状材料和这些电线 arewinding，参展光滑的表面和统一直径 (ca.40 90 毫微米)。进一步在纳米线是无定形的 HRTEM examinationshows （图 2(c)) 和 EDX 分析表明，theyconsist 纯粹的硅和氧 (图节余。计算机分析陈列，Si O 的比率是 1 2。因此，他们是很长时间非晶 SiO2 纳米线。

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